Senior Manager, Lithography and Metrology
IBM
Albany, New York, United States
Dr. Luciana Meli is the senior manager for Lithography and Metrology at IBM Semiconductor Technology Research and Development in Albany. In this role, Luciana is responsible for the demonstration and enablement of new lithography tooling, processes, materials, and metrology to support IBM’s leading-edge CMOS device and AI hardware roadmap.
Luciana received her B.S. in Chemical Engineering from the National University of Mexico, and her PhD from University of Texas at Austin in 2007, where her worked focused on self-assembly of polymer nanocomposites. After post-doctoral work at University of Minnesota and Rensselaer Polytechnic Institute. Dr. Meli is SPIE Senior member and co-author on over 100 publications.
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Powering the Scaling Roadmap with EUV Lithography
Thursday, July 11, 2024
1:55pm – 2:15pm PDT