Test program conversion using AI generative large language models Abstract: Mass production test of IC always involves multiple systems, or even dozens of systems running one single test program. However, tester availability is always challenging and it is always good to keep certain level of flexibility managing your pool of testers. Adoption dual platform is an approach from most of the companies. Sometimes a new platform is introduced based of the obsolescence of a tester. For test engineers, this means managing multiple platforms is inevitable. However, this gives test engineers with challenges in test program conversion between different platforms, such as test program development, correlation of test quality between the platforms, debugging of both platform, etc. With the advance of AI large language models, things might be easier. This paper suggests some potential approaches with examples to help those companies to leverage AI in their daily engineering life and moving forward.