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    FLEX

    FLEX Session 2: Testing and Reliability

    Tuesday, July 9, 2024
    1:30pm – 3:00pm PDT
    Location: Moscone South, Level 3, Room 301

      Session Chair (FLEX)(s)

    • CT

      Christopher Tabor

      Research Lead
      Air Force Research Laboratory
      Wright Patterson, OH, United States

    Presentations:

    • 1:30pm – 2:00pm PDT
      Dynamic Harsh Environmental FHE Reliability Testing (DHERT)

      Speaker (FLEX): Douglas R. Hackler, Sr. – American Semiconductor

    • 2:00pm – 2:30pm PDT
      Investigation of Possible Accelerated Temperature Cycling Test Methods

      Speaker (FLEX): Daniel M. Kwak – Henkel Corporation

    • 2:30pm – 3:00pm PDT
      Customized mechanical testing for characterizing fatigue performance of flexible electronics

      Speaker (FLEX): Diana D. Chin – Exponent

      Speaker (FLEX): Shuyang Fang – Exponent