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    Smart Manufacturing

    Smart Manufacturing Session 2: Front-End Manufacturing - Optimizing Yield with AI​

    Tuesday, July 9, 2024
    2:00pm – 4:55pm PDT
    Location: North Hall, Expo Floor, Smart Manufacturing Pavilion Stage

      This session dives into the exciting world of AI-powered solutions for front-end semiconductor manufacturing. We'll explore how AI/ML based tools like are revolutionizing quality control. Learn how these tools leverage edge computing and AI for real-time anomaly detection, enabling proactive maintenance and improved yield. The session will also cover cutting-edge concepts like equipment data analytics, co-optimization, and virtual metrology, which uses AI models to predict critical parameters traditionally measured by expensive tools. ​

      Presentations:

      • 2:00pm – 2:05pm PDT
        Welcome Remarks

        Session Moderator (SMfg): Doug Suerich – PEER Group

      • 2:05pm – 2:30pm PDT
        Keynote: Leveraging Generative AI for Advanced Equipment Data Analytics in Semiconductor Manufacturing

        Speaker (SMfG): Jae Yong J. Park – Samsung

      • 2:30pm – 2:50pm PDT
        Deep Topological Data Analysis and Self-Supervised Learning for Semiconductor Image Analytics

        Speaker (SMfG): Janhavi Giri – Intel Corporation

      • 2:50pm – 3:10pm PDT
        ML Based Virtual Metrology for Advanced Process Control for Improved High Product Mix Manufacturing

        Speaker (SMfG): Srividya Jayaram – Siemens Digital Industries Software

      • 3:10pm – 3:30pm PDT
        Applying Artificial Intelligence in Fab Technology Co-Optimization

        Speaker (SMfG): Jin Cho – Silvaco

      • 3:30pm – 3:50pm PDT
        Revolutionizing Semiconductor Manufacturing with AI Agents Powered by SemiKong, the First Open-Source Semiconductor Industry LLM

        Speaker (SMfG): Christopher Nguyen – Aitomatic

        Speaker (SMfG): Daisuke Oku – Tokyo Electron Limited

      • 3:50pm – 4:10pm PDT
        Enhanced Critical Defect Detection Using Machine Learning Based Guided Electron Beam Review Strategy

        Speaker (SMfG): Naor Alfassi – Applied Materials

      • 4:10pm – 4:30pm PDT
        From Lab to Fab: AI-Powered Metrology for High-Volume Manufacturing

        Speaker (SMfG): Mike Y. H Kim – Gauss Labs

      • 4:30pm – 4:50pm PDT
        Optimizing semiconductor manufacturing with AI: from Tool-level and WIP predictions to fab scheduling

        Speaker (SMfG): Sumit Sanyal, BTech – minds.ai

      • 4:50pm – 4:55pm PDT
        Closing Remarks

        Session Moderator (SMfg): Doug Suerich – PEER Group