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    Lionel C. Kimerling

    Thomas Lord Professor of Materials Science and Engineering
    Massachusetts Institute of Technology
    Cambridge, MA, United States

    Lionel C. Kimerling is the Thomas Lord Professor of Materials Science and Engineering at MIT. He is the founding Director of the MIT Microphotonics Center where he conducts an active research program in the design and processing of semiconductor materials and devices. He received his S.B. degree in Metallurgy and his Ph.D. in Materials Science from the Massachusetts Institute of Technology. He was Head of the Materials Physics Research Department at AT&T Bell Laboratories, when he joined the faculty of MIT as Professor. He served as Director of MIT’s Materials Processing Center for 15 years. Prior to joining AT&T, he served as Captain, USAF at the Solid State Sciences Laboratory of the Air Force Cambridge Research Laboratories. He has authored more than 350 technical articles and holds more than 50 patents. He leads the MIT-Industry team of the Communication Technology Roadmap. Kimerling is the recipient of the Electronics Division Award of the Electrochemical Society, the MIT Perkins Award for Excellence in Graduate Advising, the Humboldt Senior Scientist Research Award and the John Bardeen Award of TMS. He is a Fellow of the American Physical Society, a Fellow of the AAAS, a Fellow of TMS, a Fellow of MRS and a Fellow of the School of Engineering of the University of Tokyo. Professor Kimerling was the President of TMS/AIME (The Minerals, Metals and Materials Society), and President of the TMS Foundation Board of Trustees. He was chairman of the editorial board of the Journal of Electronic Materials, and a member of the National Materials Advisory Board, NRC. His research has had fundamental impact on the understanding of the chemical and electrical properties of defects in semiconductors and in the use of this knowledge for processing yield and component reliability. His research teams have enabled long-lived telecommunications lasers, developed semiconductor diagnostic methods such as DLTS, SEM-EBIC and RF-PCD, and pioneered silicon microphotonics.

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