Application Engineering Manager
n&k Technology
San Jose, CA, United States
Jeffrey Roberts is the Application Engineering Manager at n&k Technology. He has worked in the semiconductor field for over 20 years, all at n&k Technology, a leading manufacturer of scatterometry and thin film metrology tools. His responsibilities have included research and development, algorithms, modeling, software design and customer support. His past publications involve topics of OCD modeling, semiconductor manufacturing, etch monitoring, imprint lithography and photomask metrology. As the head of applications, Jeffrey is involved in all technical aspects of the n&k products, and he works closely with customers around the world to create metrology solutions that improve process control and product yield.
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DUV-Vis-NIR OCD Metrology utilizing ML for BCD Manufacturing Yield Enhancements
Wednesday, July 10, 2024
4:50pm – 6:00pm PDT