John Yi

Fellow
AMD, TX, United States

John currently manages a team of architects responsible for co-developing new DFT methods & test solutions with design and product engineering groups that span a wide spectrum of AMD products. John has been at AMD for 30 years responsible for driving many test innovations from concept to production deployment. John is an alumni of the University of Texas in Austin with a bachelor of science degree in electrical engineering.

Disclosure information not submitted.

Presentation(s):

• Test Vision Panel Session: A Foundation for a Data Driven Future: How To Define, Adapt, and Adopt Standards To Enable a More Intelligent Test Flow and Seamless Operations

  Thursday, July 11, 2024
  3:00pm – 4:00pm PDT