Paul Berndt

Principal Test Engineer
Microsoft Corporation
Redmond, WA, United States

Paul Berndt is a Principal Test Engineer at Microsoft working on Server and AI devices and is Senior Member of the IEEE with a BSEE from Northwestern University and MSEE from University of Washington with extensive experience in DFT and Test Engineering and has been in the semiconductor industry for over 39 years. In his career as a Test Engineer, Paul has also worked for such companies as Cypress Semiconductor, Western Digital, Hewlett-Packard, National Semiconductor, and Fairchild Semiconductor.

Disclosure information not submitted.

Presentation(s):

• Best ATE Paper of 2023: Award and Presentation

  Wednesday, July 10, 2024
  9:20am – 9:50am PDT

• Test Vision Panel Session: A Foundation for a Data Driven Future: How To Define, Adapt, and Adopt Standards To Enable a More Intelligent Test Flow and Seamless Operations

  Thursday, July 11, 2024
  3:00pm – 4:00pm PDT