Director of Test Technology
Advantest Corporation
san jose, California, United States
-Bob Bartlett- Director of Test Technology, Advantest Corporation
With a background in electronic warfare, computer science and device physics, Bob has been involved in all aspects of ATE and SLT design & deployment for characterization, PSV and HVM solutions for high pin count HPC and complex chiplet based devices. With roles in engineering and application at various test and semiconductor companies, he’s currently a Director of Test Technology at Advantest Corporation focused on next generation test solution definition for ML/AI and 5G devices. Additionally, as part of Advantest’s UCIe membership he participates on several working groups to address testability requirements and test access methods for UCIe chiplet designs
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Chiplet Ecosystem Testability for HVM
Thursday, July 11, 2024
10:00am – 10:15am PDT