Test
Adrian Kwan
Senior Business Development Manager
Advantest America Inc.
San Jose, CA, United States
Test Vision at SEMICON WEST is one of today’s premier gatherings of semiconductor test experts and visionaries. The goal of Test Vision is not just to discuss the latest developments in test equipment and methodologies, but to present a vision of the future of test. The conference is well attended assuring access to a wide range of expertise and experience. This year’s theme is Test in the Semiconductor Future, a theme focused on the increasing prevalence of semiconductors in new areas and fields such as electric vehicles (EV), consumer electronics, and further advances in high performance computing and AI.
Test is a critical part of semiconductor manufacturing process and while much attention is paid to the manufacturing of wafers themselves, no one would be able to ship viable products to customers without test. Test not only screens out defective units, but frequently functions as a process step to tune and adjust for parametric variations in wafer process through trim routines. Test is a unique field within the semiconductor industry. Driving innovation in test is required to enable innovation in both manufacturing process and design, as well as to reduce the cost of manufacturing enabling more end markets and penetration of semiconductors to more applications.
The new Semiconductor Future will have more material in more applications. Expanded safety critical systems will rely on the quality of semi manufacturing, and thus on test. New technologies such as heterogeneous integration, chiplets, wide bandgap materials, THz RF frequencies, and, in general, the increasing power that must be both consumed and maneuvered by semiconductors all contribute to an increasing complexity in test with new and difficult challenges to overcome.
Test Vision aims to create an open exchange of ideas in relation to this field, and foster discussion that is a true vision of the future of test, and not just a reflection of the past half century. Key topics of interest are presented below, but please remember this is not an exclusive list, and that any topic related to semiconductor test is welcome as an abstract.
Session Moderator (TV): Rich L. Dumene – Renesas Electronics Corporation
Session Moderator (TV): Stuart Pearce – AEM
Session Moderator (TV): Paul Berndt – Microsoft Corporation
Speaker (TV): Alberto Berizzi – TECHNOPROBE
Speaker (TV): Xin-Reng Foo – AMD
Keynote Speaker (TV): Keith Schaub, MSEE – Advantest
Speaker (TV): Liu Huipeng – AccoTEST
Speaker (TV): Eugene LIN – Chroma ATE
Speaker (TV): Jeff Lee – Chroma ATE Inc
Speaker (TV): Jayant C. D'Souza – Siemens DISW
Speaker (TV): Higor Batagin – SPEA S.p.A.
Speaker (TV): David Ducrocq – TERADYNE/SEG
Session Moderator (TV): Adrian Kwan – Advantest America Inc.