Test Vision Session 4: Test Data and Test Generation Enhancements

Session Moderator (TV)(s)

• 

  Rich Dumene

  Principal Test Architect
  Renesas Electronics Corporation
  DALLAS, TX, United States

Presentations:

• 12:45pm – 1:30pm PDT

  From Vision to Reality: The CHIPS Act One Year Later
  

  Keynote Speaker (TV): Travis Mosier – mySilicon Compass
• 1:30pm – 1:45pm PDT

  Thermal Measurements at the Nano-scale: Theory, Reality, and Examples
  

  Speaker (TV): John Gaskins – Laser Thermal
• 1:45pm – 2:00pm PDT

  Risk Mitigation Strategies for mmWave Production Test Environments
  

  Speaker (TV): Ryan Garrison – FormFactor
• 2:00pm – 2:15pm PDT

  Extreme Temperature Automotive Testing
  

  Speaker (TV): Andrew Westall – Teradyne
• 2:15pm – 2:30pm PDT

  Reducing Complexity and Time-to-Market with Modern Approaches to Test Development
  

  Speaker (TV): Richard W. Fanning – Teradyne
• 2:30pm – 2:45pm PDT

  Session 4 Review
  

  Session Moderator (TV): Rich L. Dumene – Renesas Electronics Corporation