This paper to present test hardware Signal Integrity (SI) design for SOC with complex I/O transmission line requirements. NXP products with high speed I/Os of different format or type. Different data rate, impedance on a single package. The concept of one size fits-all I/O impedance is replaced by IP-specific transmission line parameters. Signal path design to cater for unique trace impedances for: Ethernet, PCIE-85 Ohms Differential Impedance USB- 90 Ohms Differential Impedance DDR-80 Ohms Differential Impedance, 40 Ohms Single Ended Other I/O 100 Ohms Differential Impedance , 50 Ohms Single Ended. Transmission Line Segment integration flow as a function of pattern, data rate, S-parameters, and resulting data eye. Modeling, simulation, and validation methods to facilitate optimum performance. Multi-impedance implementation on test sockets. Layout and stack-up management on Final Test Loadboard.
