The integration of digitally controlled IC drivers and high-power devices in Power ICs such as smart switches and power stages brings new challenges for testing. Both high performance mixed signal tests and tests traditionally reserved for discrete devices such as UIS and TRT must be performed efficiently. This presentation explores the pros and cons of a traditional ‘multi-site’ approach to testing these device types compared to a ‘multi-task’ (index parallel) approach. Additionally, a flexible instrument architecture that enables a single test head to be flexibly configured for both applications via software is presented.
